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Establishes a test method to expose connectors and sockets to extremes of high and low temperatures at a specified ramp up and ramp down rate.
Author | ANSI/EIA/ECA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
Confirmation date | 2013-01-15 |
ICS | 17.200.01 : Thermodynamics in general
29.120.20 : Connecting devices |
Cross references | EIA/ECA-364-110 (2006-08), IDT
|
Year | 2006 |
Document history | |
Country | USA |
Keyword | ANSI 364;ANSI/EIA/ECA 364;364;ANSI/EIA/ECA 364-110-2006 (R2013) |