- -56%
EIA JEP 179:2006
$35.20
$15.49
Save 56%
No tax
EIA JEP 179:2006
Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount ComponentsThe purpose of this document is to explain the meaning of SPD setting (JESD21 SPD section) for DDR2 SDRAM (JESD79-2) in normal and extended temperature operationy67.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.020 : Electronic components in general
|
| Number of pages | 10 |
| Year | 2006 |
| Document history | |
| Country | USA |
| Keyword | EIA 179;179;EIA JEP179 |
New product