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EIA JEP 121A:2006
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EIA JEP 121A:2006
Requirements for Microelectronic Screening and Test OptimizationThe purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 36 |
| Replace | EIA JEP 121 (1995-04) |
| Year | 2006 |
| Document history | EIA JEP 121A (2006-10) |
| Country | USA |
| Keyword | EIA 121A;121A;EIA JEP121A |
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