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EIA JESD 74A:2007 (R2014)

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EIA JESD 74A:2007 (R2014)

Early Life Failure Rate Calculation Procedure for Semiconductor Components
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This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.

Author EIA
Editor EIA
Document type Standard
Format File
Confirmation date 2014-01-01
ICS 31.020 : Electronic components in general
Number of pages 38
Year 2007
Document history
Country USA
Keyword EIA 74A;74A;EIA JESD74A
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