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EIA JESD 89-2A:2007 (R2012)
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EIA JESD 89-2A:2007 (R2012)
Test Method for Alpha Source Accelerated Soft Error Rate| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2012-01-01 |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 20 |
| Replace | EIA JESD 89-2 (2004-11) |
| Year | 2007 |
| Document history | EIA JESD 89-2A (2007-10) |
| Country | USA |
| Keyword | EIA JESD 89;EIA 89;EIA 89.2A;89;EIA JESD89-2A |
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