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EIA JESD 51-2A:2008
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EIA JESD 51-2A:2008
Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)This document outlines the environmental conditions necessary to ensure accuracy and repeatability for a standard junction-to-ambient thermal resistance measurement in natural convection.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 22 |
| Replace | EIA JESD 51-2 (1995) |
| Year | 2008 |
| Document history | EIA JESD 51-2A (2008-01) |
| Country | USA |
| Keyword | EIA JESD 51;EIA 51;EIA 51.2A;51;EIA JESD51-2A |
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