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EIA JEP 122H:2016
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EIA JEP 122H:2016
Failure Mechanisms and Models for Semiconductor Devices| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 114 |
| Replace | EIA JEP 122G (2011-10) |
| Year | 2016 |
| Document history | EIA JEP 122H (2016-09) |
| Country | USA |
| Keyword | EIA 122H;122H;EIA JEP122H |
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