- -56%
This procedure establishes the test procedures for determining temperature rise versus current for connectors and sockets with conductor sizes equal to or less than 0000 AWG or equivalent.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
ICS | 29.120.20 : Connecting devices
|
Number of pages | 20 |
Replace | EIA/ECA-364-70B (2007-06) |
Cross references | ANSI/EIA-364-70C (2014), IDT |
Year | 2014 |
Document history | EIA-364-70C (2014-07) |
Country | USA |
Keyword | EIA 364;EIA 364.70C;EIA-364;364 |