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This standard practice establishes the procedure for testing and characterizing the sensitivity of IC's, modules, and PCB's against the effect of field-coupled pulses that are generated by ESD type pulses. The field-coupled pulses derived from the fast leading edge of transmission line pulses closely resemble electromagnetic fields as they occur inside a product subjected to human-metal ESD, such as specified by the IEC 61000-4-2. IEC 61000-4-2 is the primary standard for system level ESD test standard.
Author | ESD |
---|---|
Editor | ESD |
Document type | Standard |
Format | File |
Confirmation date | 2015-09-14 |
ICS | 17.220.20 : Measurement of electrical and magnetic quantities
31.180 : Printed circuits and boards 31.190 : Electronic component assemblies 31.200 : Integrated circuits. Microelectronics |
Year | 2015 |
Document history | |
Country | USA |
Keyword | ANSI 14;ANSI/ESD SP 14;ANSI/ESD 14;14;ANSI/ESD SP14.5-2015 |