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This document applies to any electronic component, module, or assembly exhibiting electrically induced physical damage (EIPD) that is suspected to be a result of EOS.
Author | ESD |
---|---|
Editor | ESD |
Document type | Standard |
Format | File |
Confirmation date | 2018-04-25 |
ICS | 31.080.01 : Semiconductor devices in general
43.040.10 : Electrical and electronic equipment |
Year | 2018 |
Document history | |
Country | USA |
Keyword | ANSI 27;ANSI/ESD SP 27;ANSI/ESD 27;27;ANSI/ESD SP27.1-2018 |